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Method to determine the analysis area of X-ray photoelectron spectrometers—illustrated by a Perkin-Elmer PHI 550 ESCA/SAM.

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Title: Method to determine the analysis area of X-ray photoelectron spectrometers—illustrated by a Perkin-Elmer PHI 550 ESCA/SAM.
Authors: Seah, M. P., Mathieu, H. J.
Source: Review of Scientific Instruments; May85, Vol. 56 Issue 2, p703-711, 9p
Database: Applied Science & Technology Source
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  Data: Method to determine the analysis area of X-ray photoelectron spectrometers—illustrated by a Perkin-Elmer PHI 550 ESCA/SAM.
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  Data: <searchLink fieldCode="AU" term="%22Seah%2C+M%2E+P%2E%22">Seah, M. P.</searchLink><br /><searchLink fieldCode="AU" term="%22Mathieu%2C+H%2E+J%2E%22">Mathieu, H. J.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Review+of+Scientific+Instruments%22">Review of Scientific Instruments</searchLink>; May85, Vol. 56 Issue 2, p703-711, 9p
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        Value: 10.1063/1.1138210
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      – Code: eng
        Text: English
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        PageCount: 9
        StartPage: 703
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      – TitleFull: Method to determine the analysis area of X-ray photoelectron spectrometers—illustrated by a Perkin-Elmer PHI 550 ESCA/SAM.
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              Text: May85
              Type: published
              Y: 1985
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