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Low-frequency noise in deep-submicron metal-oxide-semiconductor field-effect transistors.

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Bibliographic Details
Title: Low-frequency noise in deep-submicron metal-oxide-semiconductor field-effect transistors.
Authors: Çelik-Butler, Z.
Source: IEE Proceedings -- Circuits, Devices & Systems; February 2002, Vol. 149 Issue 1, p23-31, 9p
Database: Applied Science & Technology Source
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        Value: 10.1049/ip-cds:20020332
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              Text: February 2002
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