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Characterization of crosstalk between CMOS photodiodes.

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Bibliographic Details
Title: Characterization of crosstalk between CMOS photodiodes.
Authors: Brouk, I., Nemirovsky, Y., Lachowicz, S.
Source: Solid-State Electronics; January 2002, Vol. 46 Issue 1, p53-59, 7p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500848426
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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RecordInfo BibRecord:
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        Value: 10.1016/S0038-1101(01)00268-4
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      – Code: eng
        Text: English
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        PageCount: 7
        StartPage: 53
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      – TitleFull: Characterization of crosstalk between CMOS photodiodes.
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            NameFull: Brouk, I.
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            NameFull: Nemirovsky, Y.
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              Text: January 2002
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              Y: 2002
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