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Duet: an accurate leakage estimation and optimization tool for dual-Vt circuits.

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Bibliographic Details
Title: Duet: an accurate leakage estimation and optimization tool for dual-Vt circuits.
Authors: Sirichotiyakul, Supamas, Edwards, Tim, Oh, Chanhee
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; April 2002, Vol. 10 Issue 2, p79-90, 12p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500856235
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="AU" term="%22Sirichotiyakul%2C+Supamas%22">Sirichotiyakul, Supamas</searchLink><br /><searchLink fieldCode="AU" term="%22Edwards%2C+Tim%22">Edwards, Tim</searchLink><br /><searchLink fieldCode="AU" term="%22Oh%2C+Chanhee%22">Oh, Chanhee</searchLink>
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        Value: 10.1109/92.994980
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      – Code: eng
        Text: English
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        PageCount: 12
        StartPage: 79
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      – TitleFull: Duet: an accurate leakage estimation and optimization tool for dual-Vt circuits.
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            NameFull: Sirichotiyakul, Supamas
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            NameFull: Edwards, Tim
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            NameFull: Oh, Chanhee
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              Text: April 2002
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              Y: 2002
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              Value: 10
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