Band offset measurements of the Si3N4/GaN (0001) interface.
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| Title: | Band offset measurements of the Si3N4/GaN (0001) interface. |
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| Authors: | Cook, T. E. Jr, Fulton, C. C., Mecouch, W. J. |
| Source: | Journal of Applied Physics; September 15 2003, Vol. 94 Issue 6, p3949-3954, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.1601314 |
