Menut, D., Fichet, P., & Lacour, J. (2003). Micro-laser-induced breakdown spectroscopy technique: A powerful method for performing quantitative surface mapping on conductive and nonconductive samples. Applied Optics, 42(30), 6063. https://doi.org/10.1364/AO.42.006063
Chicago Style (17th ed.) CitationMenut, Denis, Pascal Fichet, and Jean-Luc Lacour. "Micro-laser-induced Breakdown Spectroscopy Technique: A Powerful Method for Performing Quantitative Surface Mapping on Conductive and Nonconductive Samples." Applied Optics 42, no. 30 (2003): 6063. https://doi.org/10.1364/AO.42.006063.
MLA (9th ed.) CitationMenut, Denis, et al. "Micro-laser-induced Breakdown Spectroscopy Technique: A Powerful Method for Performing Quantitative Surface Mapping on Conductive and Nonconductive Samples." Applied Optics, vol. 42, no. 30, 2003, p. 6063, https://doi.org/10.1364/AO.42.006063.