Band offset measurements of the GaN (0001)/HfO2 interface.

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Bibliographic Details
Title: Band offset measurements of the GaN (0001)/HfO2 interface.
Authors: Cook Jr. , T. E., Fulton, C. C., Mecouch, W. J.
Source: Journal of Applied Physics; December 1 2003, Vol. 94 Issue 11, p7155-7158, 4p
Database: Applied Science & Technology Source
Description
ISSN:00218979
DOI:10.1063/1.1625579