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Band offset measurements of the GaN (0001)/HfO2 interface.

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Bibliographic Details
Title: Band offset measurements of the GaN (0001)/HfO2 interface.
Authors: Cook Jr. , T. E., Fulton, C. C., Mecouch, W. J.
Source: Journal of Applied Physics; December 1 2003, Vol. 94 Issue 11, p7155-7158, 4p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500921973
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Band offset measurements of the GaN (0001)/HfO2 interface.
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  Data: <searchLink fieldCode="AU" term="%22Cook+Jr%2E+%2C+T%2E+E%2E%22">Cook Jr. , T. E.</searchLink><br /><searchLink fieldCode="AU" term="%22Fulton%2C+C%2E+C%2E%22">Fulton, C. C.</searchLink><br /><searchLink fieldCode="AU" term="%22Mecouch%2C+W%2E+J%2E%22">Mecouch, W. J.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; December 1 2003, Vol. 94 Issue 11, p7155-7158, 4p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500921973
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1063/1.1625579
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 4
        StartPage: 7155
    Titles:
      – TitleFull: Band offset measurements of the GaN (0001)/HfO2 interface.
        Type: main
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            NameFull: Cook Jr, T. E.
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            NameFull: Fulton, C. C.
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            NameFull: Mecouch, W. J.
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            – D: 01
              M: 12
              Text: December 1 2003
              Type: published
              Y: 2003
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              Value: 00218979
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              Value: 94
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              Value: 11
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            – TitleFull: Journal of Applied Physics
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