APA (7th ed.) Citation

Talwar, D. N. (2003). Characterisation of intrinsic and compensated defect microstructures in dilute III-V-N alloys. IEE Proceedings -- Circuits, Devices & Systems, 150(6), 529. https://doi.org/10.1049/ip-cds:20030915

Chicago Style (17th ed.) Citation

Talwar, D. N. "Characterisation of Intrinsic and Compensated Defect Microstructures in Dilute III-V-N Alloys." IEE Proceedings -- Circuits, Devices & Systems 150, no. 6 (2003): 529. https://doi.org/10.1049/ip-cds:20030915.

MLA (9th ed.) Citation

Talwar, D. N. "Characterisation of Intrinsic and Compensated Defect Microstructures in Dilute III-V-N Alloys." IEE Proceedings -- Circuits, Devices & Systems, vol. 150, no. 6, 2003, p. 529, https://doi.org/10.1049/ip-cds:20030915.