Characterisation of intrinsic and compensated defect microstructures in dilute III-V-N alloys.
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| Title: | Characterisation of intrinsic and compensated defect microstructures in dilute III-V-N alloys. |
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| Authors: | Talwar, D. N. |
| Source: | IEE Proceedings -- Circuits, Devices & Systems; December 2003, Vol. 150 Issue 6, p529-536, 8p |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 500923518 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Characterisation of intrinsic and compensated defect microstructures in dilute III-V-N alloys. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Talwar%2C+D%2E+N%2E%22">Talwar, D. N.</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22IEE+Proceedings+--+Circuits%2C+Devices+%26+Systems%22">IEE Proceedings -- Circuits, Devices & Systems</searchLink>; December 2003, Vol. 150 Issue 6, p529-536, 8p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500923518 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1049/ip-cds:20030915 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 8 StartPage: 529 Titles: – TitleFull: Characterisation of intrinsic and compensated defect microstructures in dilute III-V-N alloys. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Talwar, D. N. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 12 Text: December 2003 Type: published Y: 2003 Identifiers: – Type: issn-print Value: 13502409 Numbering: – Type: volume Value: 150 – Type: issue Value: 6 Titles: – TitleFull: IEE Proceedings -- Circuits, Devices & Systems Type: main |
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