APA (7th ed.) Citation

Fan, C., & Chen, M. (2002). Correlation Between Electrical Characteristics and Oxide/Polysilicon Interface Morphology for Excimer-Laser-Annealed Poly-Si TFTs. Journal of the Electrochemical Society, 149(10), G567. https://doi.org/10.1149/1.1504721

Chicago Style (17th ed.) Citation

Fan, Ching-Lin, and Mao-Chieh Chen. "Correlation Between Electrical Characteristics and Oxide/Polysilicon Interface Morphology for Excimer-Laser-Annealed Poly-Si TFTs." Journal of the Electrochemical Society 149, no. 10 (2002): G567. https://doi.org/10.1149/1.1504721.

MLA (9th ed.) Citation

Fan, Ching-Lin, and Mao-Chieh Chen. "Correlation Between Electrical Characteristics and Oxide/Polysilicon Interface Morphology for Excimer-Laser-Annealed Poly-Si TFTs." Journal of the Electrochemical Society, vol. 149, no. 10, 2002, p. G567, https://doi.org/10.1149/1.1504721.