Detection and characterization of silicon nanocrystals embedded in thin oxide layers.
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| Title: | Detection and characterization of silicon nanocrystals embedded in thin oxide layers. |
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| Authors: | Perego, M., Ferrari, S., Fanciulli, M. |
| Source: | Journal of Applied Physics; January 1 2004, Vol. 95 Issue 1, p257-262, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.1629775 |
