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SILC Dynamics in MOS Structures Subject to Periodic Stress.

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Bibliographic Details
Title:	SILC Dynamics in MOS Structures Subject to Periodic Stress.
Authors:	Irrera, Fernanda, Riccò, Bruno
Source:	IEEE Transactions on Electron Devices; October 2002, Vol. 49 Issue 10, p1729-1735, 7p
Database:	Applied Science & Technology Source

Description
ISSN:	00189383
DOI:	10.1109/TED.2002.802671