Tabib-Azar, M., Zhang, T., & LeClair, S. R. (2002). Self-Oscillating Evanescent Microwave Probes for Nondestructive Evaluations of Materials. IEEE Transactions on Instrumentation & Measurement, 51(5), 1126. https://doi.org/10.1109/TIM.2002.807798
Chicago Style (17th ed.) CitationTabib-Azar, M., Tao Zhang, and S. R. LeClair. "Self-Oscillating Evanescent Microwave Probes for Nondestructive Evaluations of Materials." IEEE Transactions on Instrumentation & Measurement 51, no. 5 (2002): 1126. https://doi.org/10.1109/TIM.2002.807798.
MLA (9th ed.) CitationTabib-Azar, M., et al. "Self-Oscillating Evanescent Microwave Probes for Nondestructive Evaluations of Materials." IEEE Transactions on Instrumentation & Measurement, vol. 51, no. 5, 2002, p. 1126, https://doi.org/10.1109/TIM.2002.807798.