Funsten, H. O., Ritzau, S. M., & Harper, R. W. (2004). Fundamental limits to detection of low-energy ions using silicon solid-state detectors. Applied Physics Letters, 84(18), 3552. https://doi.org/10.1063/1.1719272
Chicago Style (17th ed.) CitationFunsten, H. O., S. M. Ritzau, and R. W. Harper. "Fundamental Limits to Detection of Low-energy Ions Using Silicon Solid-state Detectors." Applied Physics Letters 84, no. 18 (2004): 3552. https://doi.org/10.1063/1.1719272.
MLA (9th ed.) CitationFunsten, H. O., et al. "Fundamental Limits to Detection of Low-energy Ions Using Silicon Solid-state Detectors." Applied Physics Letters, vol. 84, no. 18, 2004, p. 3552, https://doi.org/10.1063/1.1719272.
Warning: These citations may not always be 100% accurate.