Influence of the Noise Model on Level Set Active Contour Segmentation.
Saved in:
| Title: | Influence of the Noise Model on Level Set Active Contour Segmentation. |
|---|---|
| Authors: | Martin, Pascal, Réfrégier, Philippe, Goudail, François |
| Source: | IEEE Transactions on Pattern Analysis & Machine Intelligence; Jun2004, Vol. 26 Issue 6, p799-803, 5p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
|---|---|
| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 500995712 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: Influence of the Noise Model on Level Set Active Contour Segmentation. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Martin%2C+Pascal%22">Martin, Pascal</searchLink><br /><searchLink fieldCode="AU" term="%22Réfrégier%2C+Philippe%22">Réfrégier, Philippe</searchLink><br /><searchLink fieldCode="AU" term="%22Goudail%2C+François%22">Goudail, François</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Pattern+Analysis+%26+Machine+Intelligence%22">IEEE Transactions on Pattern Analysis & Machine Intelligence</searchLink>; Jun2004, Vol. 26 Issue 6, p799-803, 5p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500995712 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TPAMI.2004.11 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 5 StartPage: 799 Titles: – TitleFull: Influence of the Noise Model on Level Set Active Contour Segmentation. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Martin, Pascal – PersonEntity: Name: NameFull: Réfrégier, Philippe – PersonEntity: Name: NameFull: Goudail, François IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 06 Text: Jun2004 Type: published Y: 2004 Identifiers: – Type: issn-print Value: 01628828 Numbering: – Type: volume Value: 26 – Type: issue Value: 6 Titles: – TitleFull: IEEE Transactions on Pattern Analysis & Machine Intelligence Type: main |
| ResultId | 1 |