APA (7th ed.) Citation

Dierolf, V., Sandmann, C., & Kim, S. (2003). Ferroelectric domain imaging by defect-luminescence microscopy. Journal of Applied Physics, 93(4), 2295. https://doi.org/10.1063/1.1538333

Chicago Style (17th ed.) Citation

Dierolf, V., C. Sandmann, and S. Kim. "Ferroelectric Domain Imaging by Defect-luminescence Microscopy." Journal of Applied Physics 93, no. 4 (2003): 2295. https://doi.org/10.1063/1.1538333.

MLA (9th ed.) Citation

Dierolf, V., et al. "Ferroelectric Domain Imaging by Defect-luminescence Microscopy." Journal of Applied Physics, vol. 93, no. 4, 2003, p. 2295, https://doi.org/10.1063/1.1538333.