Ferroelectric domain imaging by defect-luminescence microscopy.
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| Title: | Ferroelectric domain imaging by defect-luminescence microscopy. |
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| Authors: | Dierolf, V., Sandmann, C., Kim, S. |
| Source: | Journal of Applied Physics; February 15 2003, Vol. 93 Issue 4, p2295-2297, 3p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.1538333 |
