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Ferroelectric domain imaging by defect-luminescence microscopy.

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Bibliographic Details
Title: Ferroelectric domain imaging by defect-luminescence microscopy.
Authors: Dierolf, V., Sandmann, C., Kim, S.
Source: Journal of Applied Physics; February 15 2003, Vol. 93 Issue 4, p2295-2297, 3p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500997569
AccessLevel: 2
PubType: Academic Journal
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  Data: Ferroelectric domain imaging by defect-luminescence microscopy.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; February 15 2003, Vol. 93 Issue 4, p2295-2297, 3p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500997569
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      – Type: doi
        Value: 10.1063/1.1538333
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      – Code: eng
        Text: English
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        PageCount: 3
        StartPage: 2295
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      – TitleFull: Ferroelectric domain imaging by defect-luminescence microscopy.
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            NameFull: Dierolf, V.
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            NameFull: Sandmann, C.
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              Text: February 15 2003
              Type: published
              Y: 2003
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