Oxygen diffusion in atomic layer deposited ZrO2 and HfO2 thin films on Si (100)

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Bibliographic Details
Title: Oxygen diffusion in atomic layer deposited ZrO2 and HfO2 thin films on Si (100)
Authors: Ferrari, S., Scarel, G.
Source: Journal of Applied Physics; 7/1/2004, Vol. 96 Issue 1, p144-149, 6p
Database: Applied Science & Technology Source
Description
ISSN:00218979
DOI:10.1063/1.1753080