APA (7th ed.) Citation

Lang, K. M., Hite, D. A., & Simmonds, R. W. (2004). Conducting atomic force microscopy for nanoscale tunnel barrier characterization. Review of Scientific Instruments, 75(8), 2726. https://doi.org/10.1063/1.1777388

Chicago Style (17th ed.) Citation

Lang, K. M., D. A. Hite, and R. W. Simmonds. "Conducting Atomic Force Microscopy for Nanoscale Tunnel Barrier Characterization." Review of Scientific Instruments 75, no. 8 (2004): 2726. https://doi.org/10.1063/1.1777388.

MLA (9th ed.) Citation

Lang, K. M., et al. "Conducting Atomic Force Microscopy for Nanoscale Tunnel Barrier Characterization." Review of Scientific Instruments, vol. 75, no. 8, 2004, p. 2726, https://doi.org/10.1063/1.1777388.