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Conducting atomic force microscopy for nanoscale tunnel barrier characterization.

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Title: Conducting atomic force microscopy for nanoscale tunnel barrier characterization.
Authors: Lang, K. M., Hite, D. A., Simmonds, R. W.
Source: Review of Scientific Instruments; Aug2004, Vol. 75 Issue 8, p2726-2731, 6p
Database: Applied Science & Technology Source
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  Data: Conducting atomic force microscopy for nanoscale tunnel barrier characterization.
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        Value: 10.1063/1.1777388
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        Text: English
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        StartPage: 2726
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      – TitleFull: Conducting atomic force microscopy for nanoscale tunnel barrier characterization.
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              Text: Aug2004
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              Y: 2004
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