Conducting atomic force microscopy for nanoscale tunnel barrier characterization.

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Bibliographic Details
Title:	Conducting atomic force microscopy for nanoscale tunnel barrier characterization.
Authors:	Lang, K. M., Hite, D. A., Simmonds, R. W.
Source:	Review of Scientific Instruments; Aug2004, Vol. 75 Issue 8, p2726-2731, 6p
Database:	Applied Science & Technology Source

Description
ISSN:	00346748
DOI:	10.1063/1.1777388