Conducting atomic force microscopy for nanoscale tunnel barrier characterization.
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| Title: | Conducting atomic force microscopy for nanoscale tunnel barrier characterization. |
|---|---|
| Authors: | Lang, K. M., Hite, D. A., Simmonds, R. W. |
| Source: | Review of Scientific Instruments; Aug2004, Vol. 75 Issue 8, p2726-2731, 6p |
| Database: | Applied Science & Technology Source |
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