Configurable Two-Dimensional Linear Feedback Shifter Registers for Parallel and Serial Built-In Self-Test.
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| Title: | Configurable Two-Dimensional Linear Feedback Shifter Registers for Parallel and Serial Built-In Self-Test. |
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| Authors: | Chen, Chien-In Henry, George, Kiran |
| Source: | IEEE Transactions on Instrumentation & Measurement; Aug2004, Vol. 53 Issue 4, p1005-1014, 10p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 501022720 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Configurable Two-Dimensional Linear Feedback Shifter Registers for Parallel and Serial Built-In Self-Test. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Chen%2C+Chien-In+Henry%22">Chen, Chien-In Henry</searchLink><br /><searchLink fieldCode="AU" term="%22George%2C+Kiran%22">George, Kiran</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Instrumentation+%26+Measurement%22">IEEE Transactions on Instrumentation & Measurement</searchLink>; Aug2004, Vol. 53 Issue 4, p1005-1014, 10p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501022720 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TIM.2004.830790 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 10 StartPage: 1005 Titles: – TitleFull: Configurable Two-Dimensional Linear Feedback Shifter Registers for Parallel and Serial Built-In Self-Test. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Chen, Chien-In Henry – PersonEntity: Name: NameFull: George, Kiran IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 08 Text: Aug2004 Type: published Y: 2004 Identifiers: – Type: issn-print Value: 00189456 Numbering: – Type: volume Value: 53 – Type: issue Value: 4 Titles: – TitleFull: IEEE Transactions on Instrumentation & Measurement Type: main |
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