APA (7th ed.) Citation

Fang, T., Jian, S., & Chuu, D. (2003). Nanotribology and fractal analysis of ZnO thin films using scanning probe microscopy. Journal of Physics: D Applied Physics, 36(7), 878. https://doi.org/10.1088/0022-3727/36/7/317

Chicago Style (17th ed.) Citation

Fang, Te-Hua, Sheng-Rui Jian, and Der-San Chuu. "Nanotribology and Fractal Analysis of ZnO Thin Films Using Scanning Probe Microscopy." Journal of Physics: D Applied Physics 36, no. 7 (2003): 878. https://doi.org/10.1088/0022-3727/36/7/317.

MLA (9th ed.) Citation

Fang, Te-Hua, et al. "Nanotribology and Fractal Analysis of ZnO Thin Films Using Scanning Probe Microscopy." Journal of Physics: D Applied Physics, vol. 36, no. 7, 2003, p. 878, https://doi.org/10.1088/0022-3727/36/7/317.