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Nanotribology and fractal analysis of ZnO thin films using scanning probe microscopy.

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Bibliographic Details
Title: Nanotribology and fractal analysis of ZnO thin films using scanning probe microscopy.
Authors: Fang, Te-Hua, Jian, Sheng-Rui, Chuu, Der-San
Source: Journal of Physics: D Applied Physics; April 7 2003, Vol. 36 Issue 7, p878-883, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501022755
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Nanotribology and fractal analysis of ZnO thin films using scanning probe microscopy.
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  Data: <searchLink fieldCode="AU" term="%22Fang%2C+Te-Hua%22">Fang, Te-Hua</searchLink><br /><searchLink fieldCode="AU" term="%22Jian%2C+Sheng-Rui%22">Jian, Sheng-Rui</searchLink><br /><searchLink fieldCode="AU" term="%22Chuu%2C+Der-San%22">Chuu, Der-San</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Physics%3A+D+Applied+Physics%22">Journal of Physics: D Applied Physics</searchLink>; April 7 2003, Vol. 36 Issue 7, p878-883, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501022755
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1088/0022-3727/36/7/317
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 878
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      – TitleFull: Nanotribology and fractal analysis of ZnO thin films using scanning probe microscopy.
        Type: main
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          Name:
            NameFull: Fang, Te-Hua
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            NameFull: Jian, Sheng-Rui
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            NameFull: Chuu, Der-San
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            – D: 07
              M: 04
              Text: April 7 2003
              Type: published
              Y: 2003
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              Value: 36
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              Value: 7
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            – TitleFull: Journal of Physics: D Applied Physics
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