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Interface instabilities and electronic properties of ZrO2 on silicon (100)

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Bibliographic Details
Title: Interface instabilities and electronic properties of ZrO2 on silicon (100)
Authors: Fulton, C. C., Cook, T. E. Jr, Lucovsky, G.
Source: Journal of Applied Physics; 9/1/2004, Vol. 96 Issue 5, p2665-2673, 9p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501029662
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Interface instabilities and electronic properties of ZrO2 on silicon (100)
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        Value: 10.1063/1.1776313
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      – Code: eng
        Text: English
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        PageCount: 9
        StartPage: 2665
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      – TitleFull: Interface instabilities and electronic properties of ZrO2 on silicon (100)
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            NameFull: Fulton, C. C.
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            – D: 01
              M: 09
              Text: 9/1/2004
              Type: published
              Y: 2004
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