Analysis of Physical Properties of III-Nitride Thin Films by Nanoindentation.

Saved in:
Bibliographic Details
Title: Analysis of Physical Properties of III-Nitride Thin Films by Nanoindentation.
Authors: Jian, Sheng-Rui, Fang, Te-Hua, Chuu, Der-San
Source: Journal of Electronic Materials; June 2003, Vol. 32 Issue 6, p496-500, 5p
Database: Applied Science & Technology Source
Be the first to leave a comment!
You must be logged in first