APA (7th ed.) Citation

Foley, E. T., Yoder, N. L., & Guisinger, N. P. (2004). Cryogenic variable temperature ultrahigh vacuum scanning tunneling microscope for single molecule studies on silicon surfaces. Review of Scientific Instruments, 75(12), 5280. https://doi.org/10.1063/1.1818871

Chicago Style (17th ed.) Citation

Foley, E. T., N. L. Yoder, and N. P. Guisinger. "Cryogenic Variable Temperature Ultrahigh Vacuum Scanning Tunneling Microscope for Single Molecule Studies on Silicon Surfaces." Review of Scientific Instruments 75, no. 12 (2004): 5280. https://doi.org/10.1063/1.1818871.

MLA (9th ed.) Citation

Foley, E. T., et al. "Cryogenic Variable Temperature Ultrahigh Vacuum Scanning Tunneling Microscope for Single Molecule Studies on Silicon Surfaces." Review of Scientific Instruments, vol. 75, no. 12, 2004, p. 5280, https://doi.org/10.1063/1.1818871.