APA (7th ed.) Citation

Alippi, C., Catelani, M., & Fort, A. (2005). Automated Selection of Test Frequencies for Fault Diagnosis in Analog Electronic Circuits. IEEE Transactions on Instrumentation & Measurement, 54(3), 1033. https://doi.org/10.1109/TIM.2005.847115

Chicago Style (17th ed.) Citation

Alippi, Cesare, Marcantonio Catelani, and Ada Fort. "Automated Selection of Test Frequencies for Fault Diagnosis in Analog Electronic Circuits." IEEE Transactions on Instrumentation & Measurement 54, no. 3 (2005): 1033. https://doi.org/10.1109/TIM.2005.847115.

MLA (9th ed.) Citation

Alippi, Cesare, et al. "Automated Selection of Test Frequencies for Fault Diagnosis in Analog Electronic Circuits." IEEE Transactions on Instrumentation & Measurement, vol. 54, no. 3, 2005, p. 1033, https://doi.org/10.1109/TIM.2005.847115.