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Automated Selection of Test Frequencies for Fault Diagnosis in Analog Electronic Circuits.

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Title: Automated Selection of Test Frequencies for Fault Diagnosis in Analog Electronic Circuits.
Authors: Alippi, Cesare, Catelani, Marcantonio, Fort, Ada
Source: IEEE Transactions on Instrumentation & Measurement; June 2005, Vol. 54 Issue 3, p1033-1044, 12p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501095448
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Automated Selection of Test Frequencies for Fault Diagnosis in Analog Electronic Circuits.
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  Data: <searchLink fieldCode="AU" term="%22Alippi%2C+Cesare%22">Alippi, Cesare</searchLink><br /><searchLink fieldCode="AU" term="%22Catelani%2C+Marcantonio%22">Catelani, Marcantonio</searchLink><br /><searchLink fieldCode="AU" term="%22Fort%2C+Ada%22">Fort, Ada</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Instrumentation+%26+Measurement%22">IEEE Transactions on Instrumentation & Measurement</searchLink>; June 2005, Vol. 54 Issue 3, p1033-1044, 12p
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        Value: 10.1109/TIM.2005.847115
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      – Code: eng
        Text: English
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        PageCount: 12
        StartPage: 1033
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      – TitleFull: Automated Selection of Test Frequencies for Fault Diagnosis in Analog Electronic Circuits.
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            NameFull: Alippi, Cesare
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            NameFull: Catelani, Marcantonio
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            NameFull: Fort, Ada
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              Text: June 2005
              Type: published
              Y: 2005
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