Holographic optical processing for submicrometer defect detection.

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Bibliographic Details
Title: Holographic optical processing for submicrometer defect detection.
Authors: Fusek, R. L., Lin, L. H., Harding, K.
Source: Optical Engineering; September/October 1985, Vol. 24, p731-734, 4p
Database: Applied Science & Technology Source
Description
ISSN:00913286