High-resolution infrared absorption measurements of Al-doped ZnSe.

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Bibliographic Details
Title: High-resolution infrared absorption measurements of Al-doped ZnSe.
Authors: Theis, W. M., Talwar, D. N., Vandevyver, M.
Source: Journal of Applied Physics; October 1 1985, Vol. 58, p2553-2558, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501117405
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: High-resolution infrared absorption measurements of Al-doped ZnSe.
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  Data: <searchLink fieldCode="AU" term="%22Theis%2C+W%2E+M%2E%22">Theis, W. M.</searchLink><br /><searchLink fieldCode="AU" term="%22Talwar%2C+D%2E+N%2E%22">Talwar, D. N.</searchLink><br /><searchLink fieldCode="AU" term="%22Vandevyver%2C+M%2E%22">Vandevyver, M.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; October 1 1985, Vol. 58, p2553-2558, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501117405
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1063/1.335935
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 6
        StartPage: 2553
    Titles:
      – TitleFull: High-resolution infrared absorption measurements of Al-doped ZnSe.
        Type: main
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          Name:
            NameFull: Theis, W. M.
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            NameFull: Talwar, D. N.
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            NameFull: Vandevyver, M.
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            – D: 01
              M: 10
              Text: October 1 1985
              Type: published
              Y: 1985
          Identifiers:
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              Value: 00218979
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              Value: 58
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            – TitleFull: Journal of Applied Physics
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