Layered synthetic microstructures for long wavelength x-ray spectrometry.

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Bibliographic Details
Title: Layered synthetic microstructures for long wavelength x-ray spectrometry.
Authors: Nicolosi, J. A., Groven, J. P., Merlo, D.
Source: Optical Engineering; August 1986, Vol. 25, p964-969, 6p
Database: Applied Science & Technology Source
Description
ISSN:00913286