Layered synthetic microstructures for long wavelength x-ray spectrometry.

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Bibliographic Details
Title: Layered synthetic microstructures for long wavelength x-ray spectrometry.
Authors: Nicolosi, J. A., Groven, J. P., Merlo, D.
Source: Optical Engineering; August 1986, Vol. 25, p964-969, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501202861
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PubType: Academic Journal
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  Data: <searchLink fieldCode="JN" term="%22Optical+Engineering%22">Optical Engineering</searchLink>; August 1986, Vol. 25, p964-969, 6p
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 964
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      – TitleFull: Layered synthetic microstructures for long wavelength x-ray spectrometry.
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            NameFull: Nicolosi, J. A.
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            NameFull: Groven, J. P.
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            NameFull: Merlo, D.
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              M: 08
              Text: August 1986
              Type: published
              Y: 1986
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              Value: 25
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