Statistics of Competing Post-Breakdown Failure Modes in Ultrathin MOS Devices.
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| Title: | Statistics of Competing Post-Breakdown Failure Modes in Ultrathin MOS Devices. |
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| Authors: | Suñé, Jordi, Wu, Ernest Y., Lai, Wing L. |
| Source: | IEEE Transactions on Electron Devices; February 2006, Vol. 53 Issue 2, p224-234, 11p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00189383 |
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| DOI: | 10.1109/TED.2005.861597 |
