[New Waves: Test, Measurement & CAD].
Saved in:
| Title: | [New Waves: Test, Measurement & CAD]. |
|---|---|
| Source: | Microwave Journal; March 2008, Vol. 51 Issue 3, p188-200, 7p |
| Database: | Applied Science & Technology Source |
|
Full text is not displayed to guests.
Login for full access.
|
|
| FullText | Links: – Type: pdflink Text: Availability: 1 |
|---|---|
| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 501218671 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: [New Waves: Test, Measurement & CAD]. – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Microwave+Journal%22">Microwave Journal</searchLink>; March 2008, Vol. 51 Issue 3, p188-200, 7p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501218671 |
| RecordInfo | BibRecord: BibEntity: Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 7 StartPage: 188 Titles: – TitleFull: [New Waves: Test, Measurement & CAD]. Type: main BibRelationships: IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 03 Text: March 2008 Type: published Y: 2008 Identifiers: – Type: issn-print Value: 01926225 Numbering: – Type: volume Value: 51 – Type: issue Value: 3 Titles: – TitleFull: Microwave Journal Type: main |
| ResultId | 1 |