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Structure Design and Optimization of 2-D LFSR-Based Multisequence Test Generator in Built-In Self-Test.

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Bibliographic Details
Title: Structure Design and Optimization of 2-D LFSR-Based Multisequence Test Generator in Built-In Self-Test.
Authors: Zhang, Xinhui, Chen, Chien-In Henry, Chakravarthy, Arvindkumar
Source: IEEE Transactions on Instrumentation & Measurement; March 2008, Vol. 57 Issue 3, p651-663, 13p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501225947
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Structure Design and Optimization of 2-D LFSR-Based Multisequence Test Generator in Built-In Self-Test.
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  Data: <searchLink fieldCode="AU" term="%22Zhang%2C+Xinhui%22">Zhang, Xinhui</searchLink><br /><searchLink fieldCode="AU" term="%22Chen%2C+Chien-In+Henry%22">Chen, Chien-In Henry</searchLink><br /><searchLink fieldCode="AU" term="%22Chakravarthy%2C+Arvindkumar%22">Chakravarthy, Arvindkumar</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Instrumentation+%26+Measurement%22">IEEE Transactions on Instrumentation & Measurement</searchLink>; March 2008, Vol. 57 Issue 3, p651-663, 13p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501225947
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TIM.2007.911707
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 13
        StartPage: 651
    Titles:
      – TitleFull: Structure Design and Optimization of 2-D LFSR-Based Multisequence Test Generator in Built-In Self-Test.
        Type: main
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      – PersonEntity:
          Name:
            NameFull: Zhang, Xinhui
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            NameFull: Chen, Chien-In Henry
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            NameFull: Chakravarthy, Arvindkumar
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          Dates:
            – D: 01
              M: 03
              Text: March 2008
              Type: published
              Y: 2008
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              Value: 57
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              Value: 3
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            – TitleFull: IEEE Transactions on Instrumentation & Measurement
              Type: main
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