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Using Mutation Analysis for Assessing and Comparing Testing Coverage Criteria.

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Title: Using Mutation Analysis for Assessing and Comparing Testing Coverage Criteria.
Authors: Andrews, James H., Briand, Lionel C., Labiche, Yvan
Source: IEEE Transactions on Software Engineering; August 2006, Vol. 32 Issue 8, p608-624, 17p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501295192
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Using Mutation Analysis for Assessing and Comparing Testing Coverage Criteria.
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  Data: <searchLink fieldCode="AU" term="%22Andrews%2C+James+H%2E%22">Andrews, James H.</searchLink><br /><searchLink fieldCode="AU" term="%22Briand%2C+Lionel+C%2E%22">Briand, Lionel C.</searchLink><br /><searchLink fieldCode="AU" term="%22Labiche%2C+Yvan%22">Labiche, Yvan</searchLink>
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        Value: 10.1109/TSE.2006.83
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        Text: English
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        PageCount: 17
        StartPage: 608
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      – TitleFull: Using Mutation Analysis for Assessing and Comparing Testing Coverage Criteria.
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            NameFull: Andrews, James H.
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              Text: August 2006
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              Y: 2006
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