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Charge Recycling in Power-Gated CMOS Circuits.

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Bibliographic Details
Title: Charge Recycling in Power-Gated CMOS Circuits.
Authors: Pakbaznia, Ehsan, Fallah, Farzan, Pedram, Massoud
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; October 2008, Vol. 27 Issue 10, p1798-1811, 14p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501322021
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="AU" term="%22Pakbaznia%2C+Ehsan%22">Pakbaznia, Ehsan</searchLink><br /><searchLink fieldCode="AU" term="%22Fallah%2C+Farzan%22">Fallah, Farzan</searchLink><br /><searchLink fieldCode="AU" term="%22Pedram%2C+Massoud%22">Pedram, Massoud</searchLink>
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1109/TCAD.2008.2003297
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 14
        StartPage: 1798
    Titles:
      – TitleFull: Charge Recycling in Power-Gated CMOS Circuits.
        Type: main
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            NameFull: Pakbaznia, Ehsan
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            NameFull: Fallah, Farzan
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            NameFull: Pedram, Massoud
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              M: 10
              Text: October 2008
              Type: published
              Y: 2008
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              Value: 27
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              Value: 10
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