Sun, Z., Wang, J., & Howe, D. (2008). Analytical Prediction of the Short-Circuit Current in Fault-Tolerant Permanent-Magnet Machines. IEEE Transactions on Industrial Electronics, 55(12), 4210. https://doi.org/10.1109/TIE.2008.2005019
Chicago Style (17th ed.) CitationSun, Zhigang, Jiabin Wang, and David Howe. "Analytical Prediction of the Short-Circuit Current in Fault-Tolerant Permanent-Magnet Machines." IEEE Transactions on Industrial Electronics 55, no. 12 (2008): 4210. https://doi.org/10.1109/TIE.2008.2005019.
MLA (9th ed.) CitationSun, Zhigang, et al. "Analytical Prediction of the Short-Circuit Current in Fault-Tolerant Permanent-Magnet Machines." IEEE Transactions on Industrial Electronics, vol. 55, no. 12, 2008, p. 4210, https://doi.org/10.1109/TIE.2008.2005019.