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Microscopic and spectroscopic mapping of dislocation-related photoluminescence in multicrystalline silicon wafers.

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Title: Microscopic and spectroscopic mapping of dislocation-related photoluminescence in multicrystalline silicon wafers.
Authors: Inoue, M., Sugimoto, H., Tajima, M.
Source: Journal of Materials Science: Materials in Electronics; Oct2008 Supplement 1, Vol. 19, pS132-S134, 3p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501358367
AccessLevel: 2
PubType: Academic Journal
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  Data: Microscopic and spectroscopic mapping of dislocation-related photoluminescence in multicrystalline silicon wafers.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Oct2008 Supplement 1, Vol. 19, pS132-S134, 3p
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      – Type: doi
        Value: 10.1007/s10854-008-9605-5
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      – Code: eng
        Text: English
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        PageCount: 3
        StartPage: S132
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      – TitleFull: Microscopic and spectroscopic mapping of dislocation-related photoluminescence in multicrystalline silicon wafers.
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            NameFull: Inoue, M.
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            NameFull: Sugimoto, H.
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            NameFull: Tajima, M.
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            – D: 02
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              Text: Oct2008 Supplement 1
              Type: published
              Y: 2008
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              Value: 19
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            – TitleFull: Journal of Materials Science: Materials in Electronics
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