Sun, L., Feng, C., & Chen, L. (2007). Dielectric Relaxation in Layer-Structured SrBi2-xNdxNb2O9 Ceramics (x = 0, 0.05, 0.2, 0.35). Journal of the American Ceramic Society, 90(1), 322. https://doi.org/10.1111/j.1551-2916.2006.01405.x
Chicago Style (17th ed.) CitationSun, Lin, Chude Feng, and Lidong Chen. "Dielectric Relaxation in Layer-Structured SrBi2-xNdxNb2O9 Ceramics (x = 0, 0.05, 0.2, 0.35)." Journal of the American Ceramic Society 90, no. 1 (2007): 322. https://doi.org/10.1111/j.1551-2916.2006.01405.x.
MLA (9th ed.) CitationSun, Lin, et al. "Dielectric Relaxation in Layer-Structured SrBi2-xNdxNb2O9 Ceramics (x = 0, 0.05, 0.2, 0.35)." Journal of the American Ceramic Society, vol. 90, no. 1, 2007, p. 322, https://doi.org/10.1111/j.1551-2916.2006.01405.x.