APA (7th ed.) Citation

Roper, C. S., Radmilovic, V., & Howe, R. T. (2009). Electrical and Mechanical Characterization of Doped and Annealed Polycrystalline 3C-SiC Thin Films. Journal of the Electrochemical Society, 156(1), D5. https://doi.org/10.1149/1.3000002

Chicago Style (17th ed.) Citation

Roper, Christopher S., Velimir Radmilovic, and Roger T. Howe. "Electrical and Mechanical Characterization of Doped and Annealed Polycrystalline 3C-SiC Thin Films." Journal of the Electrochemical Society 156, no. 1 (2009): D5. https://doi.org/10.1149/1.3000002.

MLA (9th ed.) Citation

Roper, Christopher S., et al. "Electrical and Mechanical Characterization of Doped and Annealed Polycrystalline 3C-SiC Thin Films." Journal of the Electrochemical Society, vol. 156, no. 1, 2009, p. D5, https://doi.org/10.1149/1.3000002.