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Design and Characterization of CMOS/SOI Image Sensors.

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Title: Design and Characterization of CMOS/SOI Image Sensors.
Authors: Brouk, Igor, Alameh, Kamal, Nemirovsky, Yael
Source: IEEE Transactions on Electron Devices; March 2007, Vol. 54 Issue 3, p468-475, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501395790
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Design and Characterization of CMOS/SOI Image Sensors.
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  Data: <searchLink fieldCode="AU" term="%22Brouk%2C+Igor%22">Brouk, Igor</searchLink><br /><searchLink fieldCode="AU" term="%22Alameh%2C+Kamal%22">Alameh, Kamal</searchLink><br /><searchLink fieldCode="AU" term="%22Nemirovsky%2C+Yael%22">Nemirovsky, Yael</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Electron+Devices%22">IEEE Transactions on Electron Devices</searchLink>; March 2007, Vol. 54 Issue 3, p468-475, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501395790
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1109/TED.2006.890585
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      – Code: eng
        Text: English
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        PageCount: 8
        StartPage: 468
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      – TitleFull: Design and Characterization of CMOS/SOI Image Sensors.
        Type: main
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          Name:
            NameFull: Brouk, Igor
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            NameFull: Alameh, Kamal
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            NameFull: Nemirovsky, Yael
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              M: 03
              Text: March 2007
              Type: published
              Y: 2007
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              Value: 54
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            – TitleFull: IEEE Transactions on Electron Devices
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