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Noise Temperature and Uncertainty Evaluation of a Cryogenic Noise Source by a Sliding Short Method.

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Title: Noise Temperature and Uncertainty Evaluation of a Cryogenic Noise Source by a Sliding Short Method.
Authors: Iida, Hitoshi, Shimada, Yozo, Komiyama, Koji
Source: IEEE Transactions on Instrumentation & Measurement; April 2009, Vol. 58 Issue 4, p1090-1096, 7p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501415424
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Noise Temperature and Uncertainty Evaluation of a Cryogenic Noise Source by a Sliding Short Method.
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  Data: <searchLink fieldCode="AU" term="%22Iida%2C+Hitoshi%22">Iida, Hitoshi</searchLink><br /><searchLink fieldCode="AU" term="%22Shimada%2C+Yozo%22">Shimada, Yozo</searchLink><br /><searchLink fieldCode="AU" term="%22Komiyama%2C+Koji%22">Komiyama, Koji</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Instrumentation+%26+Measurement%22">IEEE Transactions on Instrumentation & Measurement</searchLink>; April 2009, Vol. 58 Issue 4, p1090-1096, 7p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501415424
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      – Type: doi
        Value: 10.1109/TIM.2008.2008085
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      – Code: eng
        Text: English
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        PageCount: 7
        StartPage: 1090
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      – TitleFull: Noise Temperature and Uncertainty Evaluation of a Cryogenic Noise Source by a Sliding Short Method.
        Type: main
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            NameFull: Iida, Hitoshi
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            NameFull: Shimada, Yozo
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            NameFull: Komiyama, Koji
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            – D: 01
              M: 04
              Text: April 2009
              Type: published
              Y: 2009
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              Value: 58
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