APA (7th ed.) Citation

Di Guglielmo, G., Fummi, F., & Marconcini, C. (2007). Improving high-level and gate-level testing with FATE: A functional automatic test pattern generator traversing unstabilised extended FSM. IET Computers & Digital Techniques, 1(3), 187. https://doi.org/10.1049/iet-cdt:20060139

Chicago Style (17th ed.) Citation

Di Guglielmo, G., F. Fummi, and C. Marconcini. "Improving High-level and Gate-level Testing with FATE: A Functional Automatic Test Pattern Generator Traversing Unstabilised Extended FSM." IET Computers & Digital Techniques 1, no. 3 (2007): 187. https://doi.org/10.1049/iet-cdt:20060139.

MLA (9th ed.) Citation

Di Guglielmo, G., et al. "Improving High-level and Gate-level Testing with FATE: A Functional Automatic Test Pattern Generator Traversing Unstabilised Extended FSM." IET Computers & Digital Techniques, vol. 1, no. 3, 2007, p. 187, https://doi.org/10.1049/iet-cdt:20060139.