Improving high-level and gate-level testing with FATE: A functional automatic test pattern generator traversing unstabilised extended FSM.

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Bibliographic Details
Title:	Improving high-level and gate-level testing with FATE: A functional automatic test pattern generator traversing unstabilised extended FSM.
Authors:	Di Guglielmo, G., Fummi, F., Marconcini, C.
Source:	IET Computers & Digital Techniques; May 2007, Vol. 1 Issue 3, p187-196, 10p
Database:	Applied Science & Technology Source

Description
ISSN:	17518601
DOI:	10.1049/iet-cdt:20060139