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Improving high-level and gate-level testing with FATE: A functional automatic test pattern generator traversing unstabilised extended FSM.

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Title: Improving high-level and gate-level testing with FATE: A functional automatic test pattern generator traversing unstabilised extended FSM.
Authors: Di Guglielmo, G., Fummi, F., Marconcini, C.
Source: IET Computers & Digital Techniques; May 2007, Vol. 1 Issue 3, p187-196, 10p
Database: Applied Science & Technology Source
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        Value: 10.1049/iet-cdt:20060139
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        Text: English
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              Text: May 2007
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